Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kV SALVE Images of 2D-objects Matches Calculations
نویسندگان
چکیده
منابع مشابه
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1 International Center of Dielectric Research, The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China. 2 Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany. 3 Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany. 4 Shenyang National Laboratory for Material...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2016
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927616005316